Asset Health Monitoring Technologies for Increased Machinery Uptime
To remain competitive in today's global economy, companies are adopting intelligent maintenance systems to reduce costs and productivity loss resulting from equipment failures. Learn about proven machine condition monitoring technologies for predictive maintenance and downtime reduction. Successful asset health monitoring implementation boosts machinery availability and efficiency but requires specialized systems that can measure high speed signals and also perform embedded analysis.
Event Details
Date: Thursday, September 17thSchedule: 6:15 - 6:30 p.m.: Network and meet fellow attendees
6:30 - 7:30 p.m.: Buffet dinner (optional)
7:30 - 8:30 p.m.: Presentation
8:30 - 8:45 p.m.: Q&A
Location: Engineering Student Center, 1st floor of Dunham Lab at Yale University (map)
Only on-street parking is available, but no money is required in the parking meters after 7:00 p.m. Admission fee: There is no fee if you choose to join us for the presentation ONLY.
If you attend the full event, including dinner, admission is $12.00 per person ($5.00 for students).
Note that ASME New Haven is subsidizing a portion of the dinner expenses.
There is an option in the RSVP that allows each attendee to indicate "dinner and talk" or "talk only." click RSVP here
Please make your reservation by Monday, September 14th.
Christian Hahn is the Regional Program Manager for Industrial Measurements and Control Accounts at National Instruments. He is responsible for providing in-depth technical and business expertise to real-time, embedded, and industrial monitoring and control prospects and customers. During his tenure at NI, Christian has provided pre-sales technical and business consultation and post-sales support to hundreds of companies. He is frequently invited to share his expert knowledge about industry trends at tradeshows and conferences throughout the United States. Some of his recent speaking engagements include the ISA Tradeshow, the NCATC Academic Tradeshow, Sensors World, and the MFPT Conference.
Before joining NI in 2002, Christian worked as a researcher for the Design Institute for Physical Properties, the world's leading source of critically evaluated thermophysical and environmental property data. He holds a bachelor’s degree in chemical engineering from Brigham Young University.
(Portions of this biographical sketch have been paraphrased and/or copied verbatim from the NI site,
located at http://www.ni.com/company/christian-hahn.htm.)
